Blog

Vintage Optics “Russentonne”

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Bought this mirror optics called “Russentonne” with a focus length of 1000mm and a fix aperture of 10 on a flea market (for a handful euros):

Russentonnne

Because of collision with the flash mount you need to use a 2x tele converter to adapt it to a SLR:

Russentonnne-2

It’s a misery that the converter adds chromatic aberrations to the system (that is originally free of it because of ...

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SR Measurement in 1mm Spot

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Application:

Single photon counters are engaged in many scientific applications for high energy physics or biological, chemistry experiments, but can be found also in medical applications. There are many good reasons to exchange the traditional PMTs (Photo Multiplier Tubes) by digital silicon photomultipliers using a conventional CMOS process technology.

The spectral response of silicon photomultipliers has to be measured with a programmable monochromatic light source. Following plots the spectral response of a calibration diode:

idOP Spectral Response

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EMVA and Image Sensor Characterisation @RAL

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Found this dissertation (2008) when checking Googles hits of aSpect home page. EMVA Measurements where performed with idVIEW (previous
version of idMATE):

http://personal.ph.surrey.ac.uk/~phs1pr/mphys-dissertations/2007/Wallis.pdf

Results and benchmark of aSpects test platform make us happy:

 

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ATE Wafer Test Illuminator

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Application

Test Systems for optoelectronic devices (image sensor or diode) need to stimulate the DUT (device under test) with programmable illumination. aSpect provids a programmable multichannel LED illuminator (idLUX) for such applications.
High volume wafer test systems dock the ATE (Automated Test Equipment) directely on top of the wafer prober, but they do not care for space to adapt an illumination device mechanically.

Solution

aSpect integrated their LED color illuminator idLUX mechanically into Advantest 93000 test head. The idLUX copples to the water ...

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Defect Height in Thin Glas Laminates

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Challenge

OLED productions trend is to manufacture thin glas laminates from roll to roll. AOI for defect inspection is challenged by resolution requirements <10µm and the width of the substrate of min 300 mm. Most challenge is to determine the vertical position of the defect in the laminated stack, where the thickness of one layer is in the range of 30µm!

Feasibility

aSpect evaluated the vertical resolution to measure defects in thin glas laminates. The defects are sensed using dark field illumination. The vertical resolution is measured by stereoscopic ...

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Blog Started

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We are happy to present this blog where aSpect publishes news about innovations, solutions and products from time to time.

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