For now on we enlarge our report data format in idMATE to support STDF file format (“Standard Test Data Format”, developed by Teradyne Inc., binary record stream). STDF is common used in most wafer fabs . With this “quasi Standard” it becomes easy to track and analyze all your ATE (Automatic Test Equipment) results from FAB to wafer test and final test step by step. Depending on the customer’s requirements, aSpect Systems provides the test data records for a complete wafer LOT or for each wafer individually. For further Information please contact us and we will discuss your needs and how we can help.

STDF, Wafer Test

(click into the Image to enlarge the complete booth)

Vision 2016, idSTATION, Booth, Trade Show

Trade Show, Vision 2016, Booth

http://www.messe-stuttgart.de/en/vision/

We will present solutions for measurement of EMVA1288, idJUST active lens aligment, MTF measurement and idSTATION – a dark box machinery which can be used as station for many test applications. Additionally we show you many standard components (e.g. idLUX) and application specific designs. Please discuss your requirements with us, get informed about our in house test service, join a demo for our great software tool idMATE (image data proessing, instrumentation, automation) or just come over to exchange experiences and challenges in the world of imaging and test at this exciting Event.

aS-idMUX

The stimulating light source emitts stray light through cooling slits. Getting cables to a device inside a dark box can be a a nightmare. aSpects solution provides two chambers split by a massive Al base plate. The light source can be separated from the DUT (Device Under Test), which also prevents from convecting temperature to the DUT. A simple but very effective cable through suits to any confection. The whole setup is covered by plates. Joints are closed with rubber seals. Even doors – manual or automatic – are not a problem anymore shielded by intelligent design of seals with corner profiles in idSTATION:

aS-idSTATION

idSTATION – Dark Box for photonic devices

As one of the leaders in the global ranking of IC Foundry and Packaging, taiwanese equipment industry provides flexible and innovative products for the whole range of semiconductor machinery. Taiwanese equipment industry implemented a product value of 25.8 Billion Euros in 2014 which was processed by more than 13000 companies with about 250000 employees. Collaboration opportunities can be found in development and design services, vition systems, interfaces or automation of semiconductor equipment.

Mr. Alb Wang from the Ministry of Economic Affairs, R.O.C. says:
“Leveraging Taiwan’s competence in the equipment industry could be beneficial for both sides in either Marketing or Technology. Facing the global competition, Taiwanese Users such as TSMC, UMC, ASE, SPIL have opened gateways for Taiwanese equipment makers, and this is the right time to work together”

Taiwanese Semicoductor Equipment Delegation at aSpect Systems Facilities

http://www.chromaate.com
http://www.contrel.com.tw/index-e.asp
http://www.creating-nanotech.com/en/index.php
http://www.gpmcorp.com.tw/en-global
http://www.speedfam.com.tw/chinese/company.htm
http://www.utechzone.com.tw/index_e.aspx
http://www.taiwanembassy.org/de
https://www.itri.org.tw/
http://www.moeapmid.org.tw/default_page.asp

Pixel defects on image sensors are sorted by the sensor manufacturer, but particles on the glas lid of an image sensor can be added later in the process (e.g. soldering). To improve yield and prevent from consequential cost, it is important to find particles that are on top of the glas lid to be cleaned, whereas particles inside can’t.

Solution

aSpect Systems illuminator idLUX supports solutions to find and clean particles in full automatic production lines or for high end sensors in low volume production that are handled manually. The following setup depicts a “bench top” test station with a automatic particle detection and a microscope for manual cleaning. The image sensor is operated in a test socket and the measurement indicates wheather there are particles on top of the glas which have to be cleaned, or defects that cause a fail because they can not be cleaned.

idLUX, Particle Test, Image Sensor, Pixel Defect

Cleaning is done by the operator manually with a microscope. Positions of particles are indicated on the screen automatically.