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Meet us in September at SEMI European Imaging & Sensors Summit 2017

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Meet us at the “SEMI European Imaging & Sensors Summit 2017″ conference, 20-22 SeptemberĀ in Grenoble (France). Let us inform you about our new Frame Probing Service and Low Temperature Wafer Test. We are looking forward to talk to you on our exciting booth.

For additional information click here: www.semi.org/eu/imaging-and-sensors-summit-home

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About the Author:

Founder and Managing Director of aSpect Systems GmbH. Expertise in image sensor test, image data processing, optics and illumination, MTF measurements, lens alignment, camera production.

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