Posts Tagged 'idLUX'

Meet us at the Vision 2016 in Stuttgart

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This year we will exhibit at the Vision 2016 in Stuttgart from 08th to 10th of November (L-Bank Forum, Hall 1, Stand 1A33). You are invited to visit our booth and have a deeper look to our exponates.

http://www.messe-stuttgart.de/en/vision/

We will present solutions for measurement of EMVA1288, idJUST active lens aligment, MTF measurement and idSTATION – a dark box machinery which can be used as station for many test applications. Additionally we show you many standard components (e.g. idLUX) and application ...

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Particle Test and Sensor Cleaning

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Application

Pixel defects on image sensors are sorted by the sensor manufacturer, but particles on the glas lid of an image sensor can be added later in the process (e.g. soldering). To improve yield and prevent from consequential cost, it is important to find particles that are on top of the glas lid to be cleaned, whereas particles inside can’t.

Solution

aSpect Systems illuminator idLUX supports solutions to find and clean particles in full automatic production lines or for high end sensors in ...

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ATE Wafer Test Illuminator

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Application

Test Systems for optoelectronic devices (image sensor or diode) need to stimulate the DUT (device under test) with programmable illumination. aSpect provids a programmable multichannel LED illuminator (idLUX) for such applications.
High volume wafer test systems dock the ATE (Automated Test Equipment) directely on top of the wafer prober, but they do not care for space to adapt an illumination device mechanically.

Solution

aSpect integrated their LED color illuminator idLUX mechanically into Advantest 93000 test head. The idLUX copples to the water ...

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