Posts Tagged 'idMATE'

STDF result file format for idMATE

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News from aSpect Systems wafer test department:

For now on we enlarge our report data format in idMATE to support STDF file format (“Standard Test Data Format”, developed by Teradyne Inc., binary record stream). STDF is common used in most wafer fabs . With this “quasi Standard” it becomes easy to track and analyze all your ATE (Automatic Test Equipment) results from FAB to wafer test and final test step by step. Depending on the customer’s requirements, aSpect Systems provides the test ...

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EMVA 1288 – New Library for idMATE

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aSpect supports test service and equipment for EMVA measurements since many years by continous improvements: our tool for EMVA 1288 analysis and report is now available as library for the software framework idMATE!
aS-idMATE-EMVA

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EMVA and Image Sensor Characterisation @RAL

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Found this dissertation (2008) when checking Googles hits of aSpect home page. EMVA Measurements where performed with idVIEW (previous
version of idMATE):

http://personal.ph.surrey.ac.uk/~phs1pr/mphys-dissertations/2007/Wallis.pdf

Results and benchmark of aSpects test platform make us happy:

 

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